The resolution function of an X-ray triple-crystal diffractometer: comparison of experiment and theoryLUCAS, C. A; GARTSTEIN, E; COWLEY, R. A et al.Acta crystallographica. Section A, Foundations of crystallography. 1989, Vol 45, Num 6, pp 416-422, issn 0108-7673, 7 p.Article

Closed-cycle helium cryostat mount for the Huber 511.1 diffractometer circleGRAAFSMA, H; SAGERMAN, G; COPPENS, P et al.Journal of applied crystallography. 1991, Vol 24, pp 961-962, issn 0021-8898, 5Article

Screened precession method for area detectorsEDWARDS, S. L; NIELSEN, C; XUONG, N. H et al.Acta crystallographica. Section B, Structural science. 1988, Vol 44, Num 2, pp 183-187, issn 0108-7681Article

A transportable surface-science chamber for glancing-angle X-ray diffractionZSCHACK, P; COHEN, J. B; CHUNG, Y. W et al.Journal of applied crystallography. 1988, Vol 21, Num 5, pp 466-470, issn 0021-8898Article

Crystal setting by Bairsto's methodJEFFREYS, J. A. D.Journal of applied crystallography. 1992, Vol 25, issn 0021-8898, p. 648, 5Article

Calibrating an area-detector diffractometer imaging geometryTHOMAS, D. J.Proceedings of the royal society of London, series A : mathematical and physical sciences. 1989, Vol 425, Num 1868, pp 129-167, issn 0080-4630, 39 p.Article

Simple x-ray alignment monitorSTEINMEYER, P. A.Review of scientific instruments. 1988, Vol 59, Num 9, pp 2101-2102, issn 0034-6748Article

Applications industrielles de la mesure de contraintes par diffractométrie X = Industrial application of stress measurements by X-ray diffractometryMIEGE, B; BARBARIN, P; CONVERT, F et al.R.F.M. Revue française de mécanique. 1987, Num 3, pp 187-195, issn 0373-6601Article

Laser damage threshold and microfaultness of large KDP crystalsSALO, V. I; TKACHENKO, V. F; ROM, M. A et al.SPIE proceedings series. 1998, pp 540-548, isbn 0-8194-2808-6Conference Paper

Diffractometer devices controlled by a personal computerLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1991, Vol 24, pp 190-193, issn 0021-8898, 4 p., p.2Article

An automatic diffraction data collection system with an imaging plateTANAKA, I; MIN YAO; SUZUKI, M et al.Journal of applied crystallography. 1990, Vol 23, pp 334-339, issn 0021-8898, 4Article

Diffractomètre de RX automatique à relevé de coordonnées associé à un goniomètre à plusieurs cercles et à une chambre proportionnelle bidimensionnelle CARD-4ANDRIANOVA, M. E; POPOV, A. N; KHEJKER, D. M et al.Kristallografiâ. 1988, Vol 33, Num 6, pp 1509-1513, issn 0023-4761Article

Optical alignment device for x-ray diffraction systemsPRAWER, S; WILKINS, S. W.Review of scientific instruments. 1988, Vol 59, Num 3, pp 501-502, issn 0034-6748Article

A microprocessor-controlled multichannel analyser for wavelength determinationLANGE, J; BURZLAFF, H.Journal of applied crystallography. 1991, Vol 24, pp 1060-1062, issn 0021-8898, 6Article

Formation of ethylenediamine-cellulase complexes by vapor-phase treatmentLOKHANDE, H. T; THAKARE, A. M; PATIL, N. B et al.Journal of polymer science. Polymer letters edition. 1990, Vol 28, Num 1, pp 21-23, issn 0360-6384Article

A two-circle powder diffractometer for synchrotron radiation with a closed loop encoder feedback systemCERNIK, R. J; MURRAY, P. K; PATTISON, P et al.Journal of applied crystallography. 1990, Vol 23, pp 292-296, issn 0021-8898, 4Article

Calibrating an area-detector diffractometer: integral responseTHOMAS, D. J.Proceedings of the royal society of London, series A : mathematical and physical sciences. 1990, Vol 428, Num 1874, pp 181-214, issn 0080-4630Article

Possible experimental X-ray diffractometry evidence of couple-stressesGOLA, M. M; COPPA, P.Journal of applied mechanics. 1988, Vol 55, Num 3, pp 539-544, issn 0021-8936Article

Novel design for eucentric goniometer heads: a cap-in-socket tilt stageSEUL, M.Review of scientific instruments. 1988, Vol 59, Num 4, pp 668-669, issn 0034-6748Article

Thermal study of Ga₂Te₃ chalcogenideSINGH, D. P; UPRETI, U. C.SPIE proceedings series. 1998, pp 1267-1270, isbn 0-8194-2756-X, 2VolConference Paper

A method for checking X-ray diffractometer stability and its applicationFETISOV, G. V; MARKOV, V. T.Journal of applied crystallography. 1987, Vol 20, Num 4, pp 289-294, issn 0021-8898Article

A new approach for mapping x-ray rocking curvesDACHAO GAO; DAVIS, T. J; WILKINS, S. W et al.Review of scientific instruments. 1993, Vol 64, Num 7, pp 1831-1834, issn 0034-6748Article

Accurate determination of the detector parameters in an x-ray diffraction experiment with two-dimensional registrationGARMASH, A. A; ANDRIANOVA, M. E; POPOV, A. N et al.Soviet physics. Crystallography. 1991, Vol 36, Num 5, pp 627-628, issn 0038-5638Article

Angle-sensitive X-ray topographs obtained with kossel linesWITTRY, D. B; SONGQUAN SUN; CHANG, W. Z et al.Journal of applied crystallography. 1991, Vol 24, pp 999-1004, issn 0021-8898, 6Article

Preparation and characterization of gallium nitride powderTREHAN, J. C; PARASHAR, D. C; RASHMI et al.SPIE proceedings series. 1998, pp 1318-1322, isbn 0-8194-2756-X, 2VolConference Paper